Given the importance of biometric sample quality assessment in improving performance of operational systems, quality algorithms are being increasingly deployed in major identity management systems. These systems are mandating the measurement and reporting of quality scores of captured images. In order to discuss capabilities vis-a-vis operational requirements, and to identify research needs, testing requirements, and standardization gaps, NIST is holding a workshop on November 7-8, 2007. The workshop will provide a forum for experts to share their research and discuss problems and new developments. It is aimed at improving accuracy of biometric systems by incorporating quality assessment technologies into the sample acquisition process. It aims to assess current quality measurement capabilities and to identify technologies, factors, operational paradigms, and standards that can measurably improve quality. Additional program information is available at: